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JEOL Electron Detector Assembly JWS-7555S Wafer Defect Review SEM Working Spare img{max-width:100%} ASM Advanced Semiconductor Materials

SKU: 60342577221

4.7
USD755.60 USD784.60

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Description

img{max-width:100%} ASM Advanced Semiconductor Materials 02-30031 Z-Axis Stepping Driver Working

This Applied Materials SET-E832-001-Q-62 is new other surplus

Mattson Technology Part No: 37100831

Part No: 217300

Inventory # A-8384

JEOL Electron Detector Assembly JWS-7555S Wafer Defect Review SEM Working Spare img{max-width:100%} ASM Advanced Semiconductor MaterialsJEOL Electron Detector Assembly JWS 7555S Wafer Defect Review SEM Working Spare Inventory # CONF 1330 Part No: Detector Assembly Removed from a JEOL JWS 7555S Wafer Defect Review SEM Scanning Electron Microscope System This JEOL Electron Detector Assembly JWS 7555S Wafer Defect Review SEM is used working surplus. The physical condition is good, but there are signs of previous use and handling. Sale Details Item Condition: Used Working, 90 Day Warranty

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  • Final sale items are not eligible for returns or exchanges.
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