Free shipping on orders over $75 · Shop the coastal collection

JEOL High Tension Supply SEM Scanning Electron Microscope JSM-6400F Working Part No: 4S018-763

SKU: 49966817963

4.7
USD303.11 USD340.11

Pay in 4 interest-free payments of $75.78 Learn more

Shipping Estimate
USA
  • USA
  • CAN

Ships within 48 hours · Estimated delivery Sep 14 - Sep 19

Description

Part No: 4S018-763

5" Platen ETEL 591151-01-00-A Untested

Novellus 02-304871-00 RF Match Assembly Aluminum SST-PEEK 1

img{max-width:100%} Axcelis Technologies 93221 Fusion Probe Tip New Spare

This Varian 233355096 is used working surplus

JEOL High Tension Supply SEM Scanning Electron Microscope JSM-6400F Working Part No: 4S018-763JEOL High Tension Supply SEM Scanning Electron Microscope JSM 6400F Working Model No: High Tension Supply Compatible with JEOL JSM 6300F JSM 6400F SEM Scanning Electron Microscopes This item is used working surplus. The physical condition is good, but there are signs of previous use and handling. Sale Details Item Condition: Used Working, 90 Day Warranty Estimated Packed Shipping Dimensions: L x W x H = 21"x21"x24" @ 110 lbs.; Requires Freight

Exchange/Return Notes
  • We offer a 30-day return/exchange service after receiving.
  • Final sale items are not eligible for returns or exchanges.
  • To process your return/exchange, please contact us at [email protected]
  • Please click here for more details>>> Return & Exchange Policy

You may also like

recommand products